Work

A numerical analysis of the storage times of dynamic random-access memory cells incorporating ultrathin dielectrics

Year: 1998

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/16.658834

Authors: A.Y. Romanenko, W.M. Gosney

Institution: Southern Methodist University

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2108015393

FWCI: 1.964

Cites: 18

Cited by: 9

Related to: 10