Work

Critical factors affecting the 3D microstructural formation in hybrid conductive adhesive materials studied by X-ray nano-tomography

Year: 2014

Type: article

Source: Nanoscale

DOI: 10.1039/c4nr06068g

Authors: Yu-chen Karen Chen-Wiegart, Miriam Aileen Figueroa-Santos, Stanislas Petrash, Jose Garcia-Miralles, Jun Wang

Institutions: Brookhaven National Laboratory, University of Puerto Rico System, University of Puerto Rico-Mayaguez

Language: English

Topic: Electronic Packaging and Soldering Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2110870384

FWCI: 0.518

Cites: 8

Cited by: 7

Related to: 10