Refractive-index profiling of embedded microstructures in optical materials
Year: 2002
Type: article
Source: Applied Optics
DOI: 10.1364/ao.41.002038
Authors: Digant P. Davé, Thomas E. Milner
Institution: The University of Texas at Austin
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2111431258