Extension of X-parameters to include long-term dynamic memory effects
Year: 2009
Type: conference-paper
Authors: Jan Verspecht, Jason Horn, Loren Betts, Daniel Gunyan, Roger Pollard, Chad Gillease, David E. Root
Institutions: Agilent Technologies (United States), University of Leeds
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2111516837