Work

The Inverse Gaussian Process as a Degradation Model

Year: 2013

Type: article

Source: Technometrics

DOI: 10.1080/00401706.2013.830074

Authors: Zhi-Sheng Ye, Nan Chen

Institutions: Hong Kong Polytechnic University, National University of Singapore

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Center for Theoretical Sciences

OpenAlex ID: W2112935810

FWCI: 48.28

Cites: 32

Cited by: 576

Related to: 10