Work

Self-Accelerated Thermal Dissolution Model for Reset Programming in Unipolar Resistive-Switching Memory (RRAM) Devices

Year: 2009

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2008.2010584

Authors: Ugo Russo, Daniele Ielmini, Carlo Cagli, Andrea L. Lacaita

Institution: Politecnico di Milano

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2114108612

FWCI: 23.76

Cites: 25

Cited by: 394

Related to: 10