Work

Analysis of NBTI Degradation- and Recovery-Behavior Based on Ultra Fast VT-Measurements

Year: 2006

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/relphy.2006.251260

Authors: H. Reisinger, O. Blank, W. Heinrigs, A. Muhlhoff, W. Gustin, C. Schlunder

Institution: Infineon Technologies (Germany)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2114648586

FWCI: 40.09

Cites: 12

Cited by: 285

Related to: 10