Work

Nonlinear validation of arbitrary load X-parameter and measurement-based device models

Year: 2009

Type: conference-paper

Source: ARFTG Microwave Measurement Conference

DOI: 10.1109/arftg.2009.5278063

Authors: Daniel Gunyan, Jason Horn, Jianjun Xu, David E. Root

Institution: Agilent Technologies (United States)

Language: English

Topic: Advanced Power Amplifier Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2114958098

FWCI: 3.729

Cites: 6

Cited by: 18

Related to: 10