Work

Single event upset at ground level

Year: 1996

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/23.556861

Author: E. Normand

Institution: Boeing (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2116097016

FWCI: 6.991

Cites: 25

Cited by: 630

Related to: 10