Work

Quantitative characterization of electron micrograph image using fractal feature

Year: 1995

Type: article

Source: IEEE Transactions on Biomedical Engineering

DOI: 10.1109/10.464378

Author: K.L. Chan

Institution: City University of Hong Kong

Language: English

Topic: Image Retrieval and Classification Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2116498554

FWCI: 2.398

Cites: 16

Cited by: 56

Related to: 10