Work

Test structure for the detection, localization and identification of short circuits with a high speed digital tester

Year: 2003

Type: conference-paper

Source: IEEE International Conference on Microelectronic Test Structures (ICMTS)

DOI: 10.1109/icmts.1992.185956

Authors: C. Hess, L.H. Weiland

Institution: Karlsruhe Institute of Technology

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2116689793

FWCI: 0.865

Cites: 6

Cited by: 12

Related to: 10