Work

Second-level NIST Randomness Tests for Improving Test Reliability

Year: 2007

Type: conference-paper

Abstract: Testing random number generators (RNGs) is as important as designing them. The paper considers the NIST test suite SP 800-22 and shows that, as suggested by NIST itself, to reveal non-perfect generators a more in-depth analysis should be performed using the outcomes of the suite over many generated sequences. Testing these second-level statistics is not trivial and, relying on a proper model that takes into account the errors due to the approximations in the first level tests, a tuning of the parameters in the simplest cases was propose. The validity of this consideration is widely supported by experimental results on several RNG currently employed by major IT players, as well as a chaos-based RNG designed by authors.

Source: IEEE International Symposium on Circuits and Systems proceedings

DOI: 10.1109/iscas.2007.378572

Authors: Fabio Pareschi, Riccardo Rovatti, Gianluca Setti

Institutions: University of Ferrara, University of Bologna

Language: English

Topic: Cryptographic Implementations and Security

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: green

Funder: Ministero dell’Istruzione, dell’Università e della Ricerca

OpenAlex ID: W2116948326