Work

Discriminative Frequent Pattern Analysis for Effective Classification

Year: 2007

Type: conference-paper

Source: IEEE International Conference on Data Engineering (ICDE)

DOI: 10.1109/icde.2007.367917

Authors: Hong Cheng, Xifeng Yan, Jiawei Han, Chih-Wei Hsu

Institutions: University of Illinois Urbana-Champaign, IBM (United States), IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Data Mining Algorithms and Applications

Subfield: Information Systems

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2117169652

FWCI: 18.32

Cites: 38

Cited by: 369

Related to: 10