Electric field-induced hole transport in copper(i) thiocyanate (CuSCN) thin-films processed from solution at room temperature
Year: 2012
Type: article
Source: Chemical Communications
DOI: 10.1039/c2cc37065d
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2117500504
