A Bayes approach to step-stress accelerated life testing
Year: 1996
Type: article
Source: IEEE Transactions on Reliability
DOI: 10.1109/24.537021
Institutions: George Washington University, United States Air Force
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: George Washington University
OpenAlex ID: W2118245659