Work

Idealized statistical models for low-cost linear circuit yield analysis

Year: 1977

Type: article

Source: IEEE Transactions on Circuits and Systems

DOI: 10.1109/tcs.1977.1084309

Authors: Ka-Ho Leung, R. Spence

Institution: Imperial College London

Language: English

Topic: Probabilistic and Robust Engineering Design

Subfield: Computational Mechanics

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2118608106

FWCI: 3.189

Cites: 7

Cited by: 9

Related to: 10