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Interconnect limits on gigascale integration (GSI) in the 21st century

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Year: 2001
Type: article
Source: Proceedings of the IEEE
DOI: 10.1109/5.915376
Authors: J.A. Davis, R. Venkatesan, A. Kaloyeros, M. Beylansky, S.J. Souri, K. Banerjee, K.C. Saraswat, A. Rahman, R. Reif, J.D. Meindl
Institutions: Georgia Institute of Technology, State University of New York, University at Albany, State University of New York, Stanford University, Massachusetts Institute of Technology
Language: English

Topic: Copper Interconnects and Reliability
Subfield: Electronic, Optical and Magnetic Materials
Field: Materials Science
Domain: Physical Sciences
SDG: Industry, innovation and infrastructure

Open Access status: closed
OpenAlex ID: W2120149280
FWCI: 20.12
Cites: 47
Cited by: 511
Related to: 10
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