Work

Balanced probe extends high-frequency measurements

Year: 1994

Type: article

Source: IEEE Circuits and Devices Magazine

DOI: 10.1109/101.329929

Author: D.C. Smith

Institution: AT&T (United States)

Language: English

Topic: Advanced Electrical Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2120426964

FWCI:

Cites: 2

Cited by: 2

Related to: 10