Parameter compatibility relations for accelerated testing
Year: 1990
Type: article
Source: IEEE Transactions on Reliability
DOI: 10.1109/24.52621
Authors: A.K. Rajogopal, S. Teitler
Institution: United States Naval Research Laboratory
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2121673882