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A method for troubleshooting noise internal to an IC

Year: 2002

Type: conference-paper

Source: IEEE International Symposium on Electromagnetic Compatibility

DOI: 10.1109/isemc.1997.667573

Author: D.C. Smith

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2122922506

FWCI: 0.711

Cites: 2

Cited by: 4

Related to: 10