Fault-Tolerant and Scalable Key Management for Smart Grid
Year: 2011
Type: article
Source: IEEE Transactions on Smart Grid
Authors: Dapeng Wu, Chi Zhou
Institutions: University of Florida, Illinois Institute of Technology
Language: English
Subfield: Computer Networks and Communications
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Funder: U.S. Department of Energy
OpenAlex ID: W2122941544