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Test Generation for a Protocol Specified in SDL with Complex Loops by Event-based EFSM Modeling

Year: 2008

Type: article

Author: Tae Hyong Kim

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2123116871

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Cites: 10

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Related to: 10