Year: 2004
Type: article
Abstract: Electron scattering rates in metallic single-walled carbon nanotubes are studied using an atomic force microscope as an electrical probe. From the scaling of the resistance of the same nanotube with length in the low- and high-bias regimes, the mean-free paths for both regimes are inferred. The observed scattering rates are consistent with calculations for acoustic-phonon scattering at low biases and zone boundary/optical phonon scattering at high biases.
Source: Nano Letters
DOI: 10.1021/nl035258c
Authors: Ji-Yong Park, Sami Rosenblatt, Yuval Yaish, Vera Sazonova, Hande Üstünel, Stephan Braig, T. A. Arias, Piet W. Brouwer, Paul L. McEuen
Institution: Cornell University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2123273628