Work

Microscopic models for ageing in solid dielectrics

Year: 2003

Type: conference-paper

Source: International Conference on Properties and Applications of Dielectric Materials (ICPADM)

DOI: 10.1109/icpadm.1988.38319

Authors: H.R. Zeller, T. Baumann, F. Stucki

Institution: ABB (Switzerland)

Language: English

Topic: High voltage insulation and dielectric phenomena

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2123286736

FWCI:

Cites: 7

Cited by: 5

Related to: 10