Work

Non-Destructive Examination of Carbon Nanotube AFM Probes by HRTEM

Year: 2004

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927604882734

Authors: Qi Zhang, Jie Tang, Guang Yang, Gongpu Zhao, Otto Zhou, L C Qin

Institutions: University of North Carolina at Chapel Hill, National Institute for Materials Science

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2124304187

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