Application of non-normal process capability indices to semiconductor quality control
Year: 1998
Type: article
DOI: 10.1109/66.670179
Authors: S. Bittanti, M. Lovera, L. Moiraghi
Institutions: Politecnico di Milano, SunEdison (Italy)
Language: English
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W2124535833