Work

Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation

Year: 2005

Type: article

Source: IEEE Micro

DOI: 10.1109/mm.2005.110

Author: S. Borkar

Institution: Intel (United States)

Language: English

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2125169487

FWCI: 45.8

Cites: 12

Cited by: 1,338

Related to: 10