Work

Reliability evaluation of direct chip attached silicon carbide pressure transducers

Year: 2006

Type: conference-paper

Source: Proceedings of IEEE Sensors/Proceedings of IEEE Sensors ...

DOI: 10.1109/icsens.2004.1426246

Authors: R.S. Okojie, E. Savrun, Phong Nguyen, Vu Nguyen, C. Blaha

Institutions: Glenn Research Center, Sienna Technologies (United States)

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2125220931

FWCI: 0.53

Cites: 6

Cited by: 8

Related to: 10