Work

Flicker noise in CMOS transistors from subthreshold to strong inversion at various temperatures

Year: 1994

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/16.333812

Authors: Jimmin Chang, A.A. Abidi, C.R. Viswanathan

Institutions: Lattice Semiconductor (United States), University of California, Los Angeles

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2126159071

FWCI: 5.752

Cites: 28

Cited by: 305

Related to: 10