Work

Length determination of DNA fragments in atomic force microscope images

Year: 2002

Type: conference-paper

Source: Proceedings - International Conference on Image Processing

DOI: 10.1109/icip.1997.632033

Authors: T.S. Spisz, N. D'Costa, C.K. Seymour, J.H. Hoh, R. Reeves, I.N. Bankman

Institutions: Johns Hopkins University, Johns Hopkins University Applied Physics Laboratory, Johns Hopkins Medicine

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2126208232

FWCI: 1.471

Cites: 5

Cited by: 5

Related to: 10