Work

In Situ Monitoring of Anodic Oxide Growth on SI (001) by Interface Second-Harmonic Generation

Year: 1997

Type: article

Source: MRS Proceedings

DOI: 10.1557/proc-502-59

Authors: S. Janz, J. A. Bardwell

Institutions: Institute for Microstructural Sciences, National Research Council Canada

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2127134636

FWCI:

Cites: 11

Cited by:

Related to: 10