Work

Texture orientation for sorting photos "at a glance"

Year: 2002

Type: conference-paper

Source: Proceedings - International Conference on Pattern Recognition/Proceedings/International Conference on Pattern Recognition

DOI: 10.1109/icpr.1994.576325

Authors: M.M. Gorkani, R.W. Picard

Institutions: IBM (United States), IBM Research - Almaden, MIT Media Lab, Massachusetts Institute of Technology

Language: English

Topic: Image Retrieval and Classification Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2127370936

FWCI: 12.54

Cites: 20

Cited by: 189

Related to: 9