Work

The behaviour of flip-flops used as synchronizers and prediction of their failure rate

Year: 1980

Type: article

Source: IEEE Journal of Solid-State Circuits

DOI: 10.1109/jssc.1980.1051359

Author: H.J.M. Veendrick

Institutions: Philips (Netherlands), Signify (Netherlands)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2128223917

FWCI: 4.422

Cites: 6

Cited by: 228

Related to: 10