Work

Probabilistic affine invariants for recognition

Year: 2002

Type: conference-paper

Source: IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings

DOI: 10.1109/cvpr.1998.698677

Authors: T.K. Leung, M.C. Burl, P. Perona

Institutions: University of California, Berkeley, California Institute of Technology, Jet Propulsion Laboratory

Language: English

Topic: Advanced Image and Video Retrieval Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: California Institute of Technology, Engineering Research Centers

OpenAlex ID: W2128680645

FWCI: 3.012

Cites: 26

Cited by: 43

Related to: 10