Work

Measurement of the ionization rates in diffused silicon p-n junctions

Year: 1970

Type: article

Source: Solid-State Electronics

DOI: 10.1016/0038-1101(70)90139-5

Authors: R. Van Overstraeten, H. De Man

Institutions: UCLouvain, KU Leuven

Language: English

Topic: Particle Detector Development and Performance

Subfield: Nuclear and High Energy Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2128923591

FWCI: 8.141

Cites: 12

Cited by: 874

Related to: 10