Error detection by duplicated instructions in super-scalar processors
Year: 2002
Type: article
Source: IEEE Transactions on Reliability
DOI: 10.1109/24.994913
Authors: N. Oh, P.P. Shirvani, E.J. McCluskey
Institution: Stanford University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2130189691