Conductive atomic force microscopy (C-AFM) analysis of photoactive layers in inert atmosphere
Year: 2007
Type: article
Source: Organic Electronics
Authors: Alexander Alexeev, Joachim Loos
Institution: Eindhoven University of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Rijksuniversiteit Groningen
OpenAlex ID: W2131278893