Fitting the Weibull log-linear model to accelerated life-test data
Year: 2000
Type: article
Source: IEEE Transactions on Reliability
DOI: 10.1109/24.877341
Authors: W. Wang, D.B. Kececioglu
Institutions: GE Global Research (United States), University of Arizona
Language: English
Subfield: Statistics and Probability
Field: Mathematics
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2132401965