Work

A device for measuring contours or profiles

Year: 1930

Type: article

Source: American Journal of Physical Anthropology

DOI: 10.1002/ajpa.1330140313

Author: O. L. Tinklepaugh

Institution: Yale University

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2132492390

FWCI: 3.143

Cites:

Cited by: 4

Related to: 10