Work

Accurate Software-Related Average Current Drain Measurements in Embedded Systems

Year: 2007

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/tim.2007.894919

Authors: David Macii, Dario Petri

Institution: University of Trento

Language: English

Topic: Scientific Measurement and Uncertainty Evaluation

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2133107972

FWCI: 1.482

Cites: 20

Cited by: 15

Related to: 10