Work

Optical wafer level mapping for MMIC processing

Year: 2005

Type: conference-paper

Source: Conference on Semi-insulating III-V Materials (SIMC)

DOI: 10.1109/sim.1992.752696

Authors: H. Kanber, E.T. Pan, G.E. Carver, R.W. Heebner

Institutions: Hughes Aircraft (United States), AT&T (United States)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2133267631

FWCI:

Cites: 6

Cited by: 1

Related to: 10