Work

Detection of Flicker Caused by High-frequency Interharmonics

Year: 2007

Type: conference-paper

Source: Conference proceedings - IEEE Instrumentation/Measurement Technology Conference

DOI: 10.1109/imtc.2007.379393

Authors: Taekhyun Kim, Adam Wang, Edward J. Powers, W. Mack Grady, Ari Arapostathis

Institutions: The University of Texas at Austin, Stanford University

Language: English

Topic: Power Quality and Harmonics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2133379073

FWCI: 2.009

Cites: 13

Cited by: 10

Related to: 10