Work

Coherent ferroelectric switching by atomic force microscopy

Year: 2005
Type: article
Abstract: A classical energy approach is applied to study polarization reversal induced by voltage-modulated atomic force microscopy in ferroelectric single crystals and thin films. Formations of a reversed domain nucleus, its forward growth in a bulk, and sidewise expansions in a film are described by analyzing the domain energetics under an increasing external bias. It is shown that (i) the nucleation is possible even at low driving voltages, (ii) contact instability is typical for a domain in approaching an electrode, and (iii) different stages of the switching process are delimited on the voltage scale.
Language: English
Open Access status: green
OpenAlex ID: W2134010960
FWCI: 4.647
Cites: 23
Cited by: 46
Related to: 10