Electronic properties of mechanically induced kinks in single-walled carbon nanotubes
Year: 2001
Type: article
Abstract: We have used an atomic-force microscope tip to mechanically buckle single-walled carbon nanotubes. The resistance of the induced defects ranged from 10 to 100 kΩ and varied with the local Fermi level, as determined by scanned-gate microscopy. By forming two closely spaced defects on metallic nanotubes, we defined quantum dots less than 100 nm in length. These devices exhibited single-electron charging behavior at temperatures up to ∼165 K.
Source: Applied Physics Letters
DOI: 10.1063/1.1377316
Institution: Harvard University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2134690070