Work

Analytical Electron Microscopy of Thin Film / Ionic Liquid Interfaces Prepared using a Focused Ion Beam

Year: 2013

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927613010179

Authors: J.D. Sloppy, A.C. Lang, R. Devlin, H. Ghassemi, R.J. Sichel-Tissot, S. May, J.C. Idrobo, M.L. Taheri

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2135407962

FWCI: 0.184

Cites:

Cited by: 1

Related to: 10