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Deformation Models for Image Recognition
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Year:
2007
Type:
article
Source:
IEEE Transactions on Pattern Analysis and Machine Intelligence
DOI:
10.1109/tpami.2007.1153
Authors:
Daniel Keysers,
Thomas Deselaers,
Christian Gollan,
Hermann Ney
Institutions:
German Research Centre for Artificial Intelligence,
Institute of Electrical and Electronics Engineers,
RWTH Aachen University
Language:
English
Topic:
Advanced Image and Video Retrieval Techniques
Subfield:
Computer Vision and Pattern Recognition
Field:
Computer Science
Domain:
Physical Sciences
Open Access status:
closed
Funders:
Deutsche Forschungsgemeinschaft,
Bundesministerium für Bildung und Forschung,
Technische Universität Braunschweig,
RWTH Aachen University
OpenAlex ID:
W2135833910
FWCI:
13.71
Cites:
66
Cited by:
260
Related to:
10