Grain Boundary Characterization of Nanocrystalline Cu from the Stereological Analysis of Transmission Electron Microscope Orientation Maps
Work
Year: 2011
Type: article
Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Source: Microscopy and Microanalysis
Institutions Carnegie Mellon University, The University of Texas at Austin, University of Central Florida
Cites:
Cited by: 1
Related to: 10
FWCI:
Citation percentile (by year/subfield): 32.8
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: bronze