Work

Advancing the Hexapole Cs-Corrector for the Scanning Transmission Electron Microscope

Year: 2006

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927606060600

Authors: Heiko Müller, Stephan Uhlemann, Peter Hartel, Maximilian Haider

Institution: Corrected Electron Optical Systems (Germany)

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W2136237632

FWCI: 6.463

Cites: 13

Cited by: 116

Related to: 10