Work

A shewhart‐like charting technique for high yield processes

Year: 1995

Type: article

Source: Quality and Reliability Engineering International

DOI: 10.1002/qre.4680110309

Authors: W. Xie, M. Xie, T. N. Goh

Institutions: Linköping University, National University of Singapore, KTH Royal Institute of Technology, Xi'an Jiaotong University, University of Wisconsin–Madison

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2136264975

FWCI:

Cites: 12

Cited by: 33

Related to: 10