Work

A New Physical Mechanism for Soft Errors in Dynamic Memories

Year: 1978

Type: conference-paper

Source: IEEE International Reliability Physics Symposium proceedings

DOI: 10.1109/irps.1978.362815

Authors: Timothy C. May, Murray H. Woods

Institution: Intel (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2136476145

FWCI: 19.03

Cites:

Cited by: 252

Related to: 10